Keithley Simplify IV CV Eguide free download

File name Simplify_IV_CV_Eguide.pdf

Tips, Tools and Techniques that Simplify I-V and C-V Characterization A G R E AT E R M E A S U R E O F C O N F I D E N C E T O O L S , T I P S , A N D T E C H N I Q U E S T H AT S I M P L I F Y I -V A N D C -V C H A R A C T E R I Z AT I O N previous index next Tools, Tips, and Techniques that Simplify I-V and C-V Characterization Introduction Semiconductor characterization presents a wide range of test challenges. This e-Guide offers an overview of advanced tools, tips, and techniques that you can use to simplify the I-V and C-V measurements that are essential to characterizing emerging semiconductor materials, devices, and processes. Table of Contents Making Accurate I-V and C-V Measurements ... 3 Ensuring C-V Measurement Integrity ... 4-5 Preventing C-V Measurement Errors While Reducing Test Times... 6 New C-V Measurement Techniques for High Impedance Devices ... 7 Measuring Sub-Picoamp Currents Accurately ... 8 Combining I-V, C-V, and Pulse I-V Measurements in One System ... 9 2 T O O L S , T I P S , A N D T E C H N I Q U E S T H AT S I M P L I F Y I -V A N D